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High Voltage System SourceMeter for High Power Semiconductor Test

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Keithley Instruments introduced Model 2657A High Power System SourceMeter instrument. This model adds high voltage to the company’s Series 2600A System SourceMeter family of high speed, precision source measurement units. Together, these instruments allow Keithley’s customers to characterize an even broader range of power semiconductor devices and materials.

There is a built-in 3,000V, 180W source and a high speed 6-1/2-digit measurement engine that enables 1fA (femtoamp) current measurement resolution to support the low-leakage requirements of next-generation power semiconductor devices.
The Model 2657A is optimized for high voltage applications such as testing power semiconductor devices, including diodes, FETs and IGBTs, as well as characterizing newer materials such as gallium nitride (GaN), silicon carbide (SiC) and other compound semiconductor materials and devices. It is also useful for characterizing high-speed transients and performing breakdown and leakage tests on a variety of electronic devices at up to 3,000V.
www.keithley.com

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