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Keithley Publishes E-Guide on Making Ultra-Fast I-V Measurements

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Keithley Instruments has published an informative e-guide titled “Ultra-Fast I-V Applications for the Model 4225-PMU Ultra-Fast I-V Module”. Free copy is downloadable upon request from Keithley at: http://www.keithley.com/promo/pr/1107.

The 24-page e-guide provides an overview of ultra-fast I-V sourcing and measurement and why these have become increasingly important capabilities for many technologies, including compound semiconductors, non-volatile memory (NVM), MEMS devices, nanodevices, solar cells, and CMOS devices. Using pulsed I-V signals to characterize devices rather than DC signals makes it possible to study or reduce the effects of self-heating (joule heating) or to minimize current drift or degradation in measurements due to trapped charge. Transient I-V measurements allow scientists and engineers to capture ultra high speed current or voltage waveforms in the time domain or to study dynamic test circuits. Pulsed sourcing can be used to stress test a device using an AC signal during reliability cycling or in a multi-level waveform mode to program/erase memory devices.
www.keithley.com

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