JTAG Technologies has introduced the JT 2149/DAF, a compact, mixed-signal (digital/analog/frequency) measurement module. The JT 2149/DAF is the first unit of its type to offer both digital and analog test access to PCBs via JTAG Technologies’s widely-used QuadPod signal conditioning interface.
The JT 2149/DAF module has been designed to slot into JTAG Technologies’s regular QuadPod transceiver system as used by the renowned DataBlaster series of boundary-scan/JTAG controller hardware. When connected to a circuit board via edge connector or test fixture/jig test pins the module enhances standard digital boundary-scan tests by enabling a series of analog and frequency measurements to be made.
Capabilities of the JT 2149/DAF module include 16 dual-purpose digital pins capable of digital I/O stimulus and response at voltages of 1.0 to 3.6V, plus frequency measurements of up to 128MHz on any pin. 12 additional analog measurement channels can capture values from 0 to 33V with better than 10mV resolution.