Saelig now offers the Siglent SMM3000X Series source measure unit (SMU) with four-quadrant operation, enabling simultaneous sourcing and measurement for closed-loop operations on test devices. These SMUs function as a voltage source, current source, voltmeter, ammeter, and ohmmeter, and also support pulse generation and arbitrary waveform output. This makes an ideal platform for characterising semiconductors and other non-linear devices and materials.
SMM3000X instruments feature 6½-digit resolution, with output capability of up to ±210V DC voltage, ±3.03A DC current, and ±10.5A pulsed current, with programming and measurement resolution down to 10fA/100nV, and a maximum acquisition rate of 100,000 points/s. The series features a 5-inch high-resolution capacitive touchscreen for intuitive operation, and includes USB and LAN interfaces for seamless PC connectivity and automation.
In pulse mode, the SMM3000X series supports pulsed current output up to 10.5A, with a minimum pulse width of 50μs. This allows for the precise emulation of transient operating conditions in power devices—such as switching loss testing for GaN and SiC devices—providing robust support for the R&D and validation of wide-bandgap power semiconductors.
The SMM3000X also supports linear, log, and pulsed sweep modes to facilitate the rapid characterization of components such as diodes and transistors, allowing engineers to extract I-V curves and analyze conduction behavior under various operating conditions.
The SMM3000X series is designed to meet the precision testing requirements of third-generation semiconductors, advanced optoelectronic devices, and emerging materials. It also significantly accelerates development cycles for new-energy batteries and high-density integrated circuits. By improving both test efficiency and measurement accuracy, it provides a powerful foundation for product development and innovation.
