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Tektronix Showcases New and Enhanced Optical Test Solutions at ECOC 2013

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Tektronix will be showing a wide-range of optical test and measurement products at ECOC 2013 (Stand 638, Hall N8-N10), which takes place from 23-25 September in London.

The displayed products will address a wide range of applications, from multi-channel pattern generation and multi-channel BERT testing to coherent lightwave signal analysis and testing of the world’s most complex components. Visitors to the Tektronix stand will be able to get hands-on demonstrations and technical advice to help them solve their individual test and measurement challenges. On hand will be the new AWG70000 series arbitrary waveform generator that offers the industry’s best combination of high sample rate, long waveform memory and deep dynamic range.

 

“Tektronix has launched a number of exciting new technology measurement solutions, that help our customers deal with new challenges in High Speed Serial, Optical, Photonic and Communication System Designs,” said Dean Miles, Technical Marketing Manager at Tektronix.

Tektronix Inc.
www.tektronix.com

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