The New Moortec Embedded Process Detector (MEPD) circuit provides the means for advanced node Integrated Circuit (IC) developers to detect the process variations brought about by manufacturing variability and drift of advanced node core digital MOS devices.

The Process Detector can be used to enable a continuous Dynamic Voltage & Frequency Scaling (DVFS) optimisation system, monitor manufacturing variations on and if required, across chip, gate delay measurements, critical path analysis, critical voltage analysis and also monitor silicon ‘aging’.

Moortec Semiconductor says that on-chip Process, Voltage and Temperature (PVT) monitoring has become a vital factor in the design and performance optimisation of small-geometry designs. Using monitors embedded within System on Chip (SoC) designs allows for greater dynamic performance optimization. www.moortec.com