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Test & Measurement

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02 June 2008 13:21

Agilent Technologies’ New Portable Radio Tester Saves Time, Training with One-Button Functionality at Operational, Intermediate Military Levels

Agilent Technologies has today introduced a rugged, portable radio tester that enables one-button testing of FM and SINCGARS (SINgle Channel Ground Air Radio System) radios at both the operational and intermediate military testing levels
     
The advanced diagnostics available

01 May 2008 13:49

Automated Characterization Suite (ACS) Test System Now Completes Wafer Level Reliability Testing up to Five Times Faster

Keithley Instruments, a specialist in solutions for emerging measurement needs, has enhanced its Automated Characterization Suite (ACS) software to include optional wafer level reliability (WLR) test tools for semiconductor reliability and lifetime prediction testing applications. Version 4.0 builds

21 April 2008 15:54

PC-based data-acquisition system combines high performance and ease of use

The new Yokogawa SL1000 is a PC-based data-acquisition unit designed to provide high-speed data logging and fast data transfer in electro-mechanical and power measurement applications.

18 February 2008 17:00

Aeroflex releases new RF spectrum analyzer option and P25 capabilities for the 3500 hand-held radio test set

Aeroflex has announced the release of a new RF spectrum analyzer option for the 3500 hand-held 1GHz radio test set. The new spectrum analyzer option now allows users to see the signal they are receiving instead of just

18 February 2008 10:59

TTi provides quick and reliable audio testing against limits

TTi has announced that the AP High Speed Tester (HST) application is now available for use with the Audio Precision AP2700 Series audio analyser.

31 January 2008 16:59

Agilent Technologies Unveils Industry’s First DDR2, DDR3 BGA Probe Solution for Oscilloscopes, Logic Analyzers

Agilent Technologies has today unveiled the industry's first DDR2 and DDR3 ball-grid array (BGA) probes for oscilloscopes and logic analyzers.
    
Dynamic random access memory (DRAM) data rates have increased significantly over the past few years. Hence,

10 January 2008 15:44

Agilent Technologies introduces FlexRay automotive application for Infiniium Series oscilloscopes

Agilent Technologies has introduced a measurement application that provides comprehensive FlexRay triggering, protocol decode, debug and eye-diagram analysis capabilities for Infiniium Series oscilloscopes. This measurement solution allows automotive designers who use embedded microprocessors to verify proper signal integrity
07 December 2007 10:14

Yokogawa launches new compact optical spectrum analyser

Yokogawa launches new compact optical spectrum analyser

The new Yokogawa AQ6375 is the 'world's first' optical spectrum analyser to combine a wide wavelength range of 1200 to 2400 nm with high resolution - between 50 pm and 2 nm - and high sensitivity of -70

05 December 2007 09:58

Wideband power sensor for radar and digital communications testing to 18 GHz

Wideband power sensor for radar and digital communications testing to 18 GHz

The new Rohde & Schwarz NRP-Z81 wideband power sensor is now available from TTi (Thurlby Thandar Instruments).

04 December 2007 10:50

Strategic Test Extends PCI Express series with 2-channel, 125 MS/s 8-bit Arbitrary Waveform Generator

Strategic Test, one of the world's leading suppliers of PC-based instrument boards, has announced the UF2e-6110 two-channel 125 MS/s 8-bit Arbitrary Waveform Generator (AWG) PCI Express card.
 
With synchronous multi-channel capability, the AWG card is well

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