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01 May, 2008 13:49
Automated Characterization Suite (ACS) Test System Now Completes Wafer Level Reliability Testing up to Five Times Faster (News)
Keithley Instruments, a specialist in solutions for emerging measurement needs, has enhanced its Automated Characterization Suite (ACS) software to include optional wafer level reliability (WLR) test tools for semiconductor reliability and lifetime prediction testing applications. Version 4.0 builds
05 February, 2008 11:10
MIT and Texas Instruments develop energy-efficient microchip (News)
Researchers at MIT and Texas Instruments have unveiled a new chip design for portable electronics that can be up to ten times more energy-efficient than present technology. The design could lead to cell phones, implantable medical devices and
27 February, 2008 15:51