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Keithley Releases CD of Semiconductor Device Test Applications (News)
Keithley Instruments, a leader in solutions for emerging measurement needs, has announced the availability of the Semiconductor Device Test Applications Guide. In addition to the Applications Guide, the CD also includes a large variety of semiconductor test application
New Tutorial Poster for WiMAX Measurement from Keithley (News)
Keithley Instruments, a leader in solutions for emerging measurement needs, has published a new poster that illustrates the key measurement tools and software analysis techniques required for measuring complex WiMAX signals. The poster is available at no charge
Keithley Expands MIMO RF Measurement Capabilities with Industry’s First 8x8 MIMO Test System (News)
Keithley Instruments, a leader in solutions for emerging measurement needs, is extending its lead in RF MIMO (multiple-input, multiple-output) test with the industry's first measurement-grade 8x8 MIMO system. The system is used for primary research of next-generation RF
Keithley Expands 3700 System Switch/Multimeter Line with New Plug-In Cards (News)
Keithley Instruments, a leader in solutions for emerging measurement needs, has announced an expansion of its Series 3700 System Switch/Multimeter and Plug-in Card Family with the addition of two new plug-in cards, the Model 3724 Dual 1X30 Solid
Keithley ACS Version 3.2 Offers New Parallel Test and Parametric Die Sort Features for Higher Throughput (News)
Keithley Instruments, a leader in solutions for emerging measurement needs, has announced the availability of ACS (Automated Characterization Suite) V3.2 software for semiconductor test and characterization at the device, wafer, and cassette level. Version 3.2 further enhances the