Keithley Releases CD of Semiconductor Device Test Applications
Keithley Instruments, a leader in solutions for emerging measurement needs, has announced the availability of the Semiconductor Device Test Applications Guide. In addition to the Applications Guide, the CD also includes a large variety of semiconductor test application information such as applications notes, white papers, and presentations that enables users to reduce their cost of test while simplifying the most challenging applications.
The Semiconductor Device Test Applications Guide is divided into six main sections with topics including:
· Two-terminal device tests
· Bipolar transistor tests
· FET tests
· Substrate bias
· High power tests
The Semiconductor Device Test Applications Guide features more than a dozen application notes on topics such as on-the-fly Vth measurements for bias temperature instability characterization, increasing production throughput of multi-pin devices, optimizing switched measurements, white papers on test sequencing instruments and the fundamentals of the LXI communication protocol, six presentations, and an appendix of test scripts.
The Semiconductor Device Test Applications Guide is available free of charge at http://www.ggcomm.com/Keithley/May08PR_SemiAppsGuide.html
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